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Atomic-Resolution Composition Mapping in EDS STEM

  • Nathan R Lugg (a1), Akihito Kumamoto (a1), Ryo Ishikawa (a1), undefined Bin Feng (a1), Gerald Kothleitner (a2) (a3), Naoya Shibata (a1) and Yuichi Ikuhara (a1)...
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Abstract
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References
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[1] D’Alfonso AJ, Freitag B, Klenov DO & Allen LJ PRB 81 (2010) 100101.
[2] Kotula PG, Klenov DO & Von Harrach HS Microsc Microanal 18 (2012). p. 691.
[3] Kothleitner G, Neish MJ, Lugg NR, Findlay SD, Grogger W, Hofer F & Allen LJ PRL 112 (2014) 085501.
[4] Lugg NR, Kothleitner G, Shibata N & Ikuhara Y Ultramicr 151 (2015) 150.
[5] Xin HL, Dwyer C & Muller DA Ultramic 139 (2014) 38.
[6] Chen Z, D’Alfonso AJ, Weyland M, Taplin DJ, Allen LJ & Findlay SD Ultramic 157 (2015) 21.
[7] Lugg NR, Haruta M, Neish MJ, Findlay SD, Mizoguchi T, Kimoto K & Allen LJ APL 101 (2012) 183112.
[8] This work is partly supported by: Grant-in-Aid for Scientific Research on Innovative Areas “Nano Informatics” (Grant No. 25106003) from Japan Society for the Promotion of Science (JSPS) and “Nanotechnology Platform” (Project No. 12024046) of the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan, Grants-in-Aid for Scientific Research (A) (15H02290) and Grant-in-Aid for Scientific Research (B) (26289234) from the JSPS.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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