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Atomic-scale Chemical Manipulation of Materials in the Scanning Transmission Electron Microscope under Controlled Atmospheres

Published online by Cambridge University Press:  05 August 2019

Gregor T Leuthner
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Clemens Mangler
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Jannik C Meyer
Affiliation:
University of Tübingen, Institute of Applied Physics, Tübingen, Germany
Toma Susi
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Jani Kotakoski
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Corresponding
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Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hotz, M et al. , Microsc. Microanal. 22 (Suppl 3) (2016), p. 34.CrossRefGoogle Scholar
[2]Leuthner, G T et al. , Ultramic. in press (2019), doi: 10.1016/j.ultramic.2019.02.002.Google Scholar
[3]Susi, T et al. , Nat. Commun. 7 (2016), 13040.CrossRefGoogle Scholar
[4]Kotakoski, J et al. , ACS Nano 6 (2012), p. 671.CrossRefGoogle Scholar
[5]Tripathi, M et al. , Phys. Status Solidi (RRL) 11 (2017), 1700124.CrossRefGoogle Scholar
[6]Inani, H et al. , arXiv:1902.02611 [cond-mat.mtrl-sci] (2019).Google Scholar
[7]Kotakoski, J et al. , Nano Lett. 15 (2015), p. 5944.CrossRefGoogle Scholar
[8]The authors acknowledge funding from the University of Vienna uni:docs fellowship programme, the Austrian Science Fund (FWF) through projects I3181 and P31605 as well as the Wiener Wissenschafts-, Forschungs- und Technologiefonds (WWTF) through project MA14-009.Google Scholar

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