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Beam-induced Changes of FePt Nanoparticles during STEM In-situ Annealing

  • J Wittig (a1), J Bentley (a2), LF Allard (a2), MS Wellons (a1) and C Lukehart (a1)...
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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