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A Convolutional Neural Network Approach to Thickness Determination using Position Averaged Convergent Beam Electron Diffraction

Published online by Cambridge University Press:  04 August 2017

Weizong Xu  and
James M. LeBeau
Weizong Xu
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 120 - 121
Copyright
© Microscopy Society of America 2017 

References

[1] LeBeau, J, et al, Ultramicroscopy 110 2010). p. 118.CrossRefGoogle Scholar
[2] Krizhevsky, A, Sutskever, I & Hinton, G Advances in Neural Information Processing Systems 25 2012). p. 1097.Google Scholar
[3] Pan, S & Yang, Q IEEE Transactions on Knowledge and Data Engineering 22 2010). p. 1345.CrossRefGoogle Scholar
[4] Srivastava, N, et al, Journal of Machine Learning Research 15 2014). p. 1929.Google Scholar
[5] The authors acknowledge the support from the National Science Foundation (NSF) (DMR-1350273, DMR-1151568) and Air Force Office of Scientific Research (FA9550-14-1-0182). We thank analytical Instrumentation Facility (AIF) at North Carolina State University supported by the State of North Carolina, the National Science Foundation (ECCS-1542015) and the North Carolina Research Triangle Nanotechnology Network from the National Nanotechnology Coordinated Infrastructure..Google Scholar