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    This article has been cited by the following publications. This list is generated based on data provided by CrossRef.

    Boden, Stuart A. 2016. Helium Ion Microscopy.

    Hlawacek, Gregor Veligura, Vasilisa van Gastel, Raoul and Poelsema, Bene 2016. Helium Ion Microscopy.

    Notte, John and Huang, Jason 2016. Helium Ion Microscopy.

    Woehl, Taylor J. White, Ryan M. and Keller, Robert R. 2016. Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel Plate. Microscopy and Microanalysis, Vol. 22, Issue. 03, p. 544.

    Fox, Daniel Zhou, Yangbo and Zhang, Hongzhou 2015. Nanotubes and Nanosheets.

    Hlawacek, Gregor Veligura, Vasilisa van Gastel, Raoul and Poelsema, Bene 2014. Helium ion microscopy. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 32, Issue. 2, p. 020801.

    D'Alfonso, A.J. Forbes, B.D. and Allen, L.J. 2013. The interaction of a nanoscale coherent helium-ion probe with a crystal. Ultramicroscopy, Vol. 134, p. 18.

    Hill, Ray Notte, John A. and Scipioni, Larry 2012.

    Idrobo, J. C. and Pennycook, S. J. 2011. Vortex beams for atomic resolution dichroism. Microscopy, Vol. 60, Issue. 5, p. 295.


Diffraction Imaging in a He+ Ion Beam Scanning Transmission Microscope

  • John Notte IV (a1), Raymond Hill (a1), Sean M. McVey (a1), Ranjan Ramachandra (a2), Brendan Griffin (a2) (a3) and David Joy (a2) (a4)
  • DOI:
  • Published online: 01 August 2010

The scanning helium ion microscope has been used in transmission mode to investigate both the feasibility of this approach and the utility of the signal content and the image information available. Operating at 40 keV the penetration of the ion beam, and the imaging resolution achieved, in MgO crystals was found to be in good agreement with values predicted by Monte Carlo modeling. The bright-field and annular dark-field signals displayed the anticipated contrasts associated with beam absorption and scattering. In addition, the diffraction of the He ion beam within the sample gave rise to crystallographic contrast effects in the form of thickness fringes and dislocation images. Scanning transmission He ion microscopy thus achieves useful sample penetration and provides nanometer scale resolution, high contrast images of crystalline materials and crystal defects even at modest beam energies.

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M. Bernheim (1973). Influence of channeling on secondary emission yields. Rad Effects 18, 231234.

J. Frank & L. El Ali (1975). Signal to noise ratio of electron micrographs obtained by cross-correlation. Nature 256, 376379.

R. Heidenreich (1949). Electron microscope and diffraction study of metal crystal textures by means of thin sections. J Appl Phys 20, 9931010.

R. Ramachandra , B. Griffin & D.C. Joy (2009). A model of secondary electron imaging in the helium ion scanning microscope. Ultramicroscopy 109, 748757.

D.B. Williams & C.B. Carter (1996). Transmission Electron Microscopy, Chap. 13. New York: Plenum Press.

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
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