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Diffraction Imaging in a He+ Ion Beam Scanning Transmission Microscope

  • John Notte IV (a1), Raymond Hill (a1), Sean M. McVey (a1), Ranjan Ramachandra (a2), Brendan Griffin (a2) (a3) and David Joy (a2) (a4)...
Abstract
Abstract

The scanning helium ion microscope has been used in transmission mode to investigate both the feasibility of this approach and the utility of the signal content and the image information available. Operating at 40 keV the penetration of the ion beam, and the imaging resolution achieved, in MgO crystals was found to be in good agreement with values predicted by Monte Carlo modeling. The bright-field and annular dark-field signals displayed the anticipated contrasts associated with beam absorption and scattering. In addition, the diffraction of the He ion beam within the sample gave rise to crystallographic contrast effects in the form of thickness fringes and dislocation images. Scanning transmission He ion microscopy thus achieves useful sample penetration and provides nanometer scale resolution, high contrast images of crystalline materials and crystal defects even at modest beam energies.

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Corresponding author
Corresponding author. E-mail: djoy@utk.edu
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This list contains references from the content that can be linked to their source. For a full set of references and notes please see the PDF or HTML where available.

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R. Ramachandra , B. Griffin & D.C. Joy (2009). A model of secondary electron imaging in the helium ion scanning microscope. Ultramicroscopy 109, 748757.


D.B. Williams & C.B. Carter (1996). Transmission Electron Microscopy, Chap. 13. New York: Plenum Press.

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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