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FIB Preparation of Holes with Large Aspect Ratio

  • J Thomas (a1), H Wendrock (a1), B Arnold (a1) and D Lohse (a1)
Abstract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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