Hostname: page-component-8448b6f56d-m8qmq Total loading time: 0 Render date: 2024-04-15T19:46:14.953Z Has data issue: false hasContentIssue false

Effects of Focused-Ion-Beam Processing on Local Electrical Measurements of Inorganic Solar Cells

Published online by Cambridge University Press:  27 August 2014

Heayoung P. Yoon
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology,Gaithersburg, Maryland, 20899, USA Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland, 20742, USA
Paul M. Haney
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology,Gaithersburg, Maryland, 20899, USA
Joshua Schumacher
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology,Gaithersburg, Maryland, 20899, USA
Kerry Siebein
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology,Gaithersburg, Maryland, 20899, USA
Yohan Yoon
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology,Gaithersburg, Maryland, 20899, USA Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland, 20742, USA
Nikolai B. Zhitenev
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology,Gaithersburg, Maryland, 20899, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Leamy, H. J., Appl, J Phys 53, R51-R80 (1982); H. P. Yoon et al., Solar Energy Mater. Solar Cells 117 (2013), p. 499.Google Scholar
[2] Cooper, D., Rivallin, P., Hartmann, J-M., Chabli, A., and Dunin-Borkowski, R. E. J. Appl. Phys.106 (2009), p. 064506.Google Scholar
[3] Yakimov, E.B., Borisov, S.S., and Zaitsev, S.I. Russ. Phys. Semicond. 41 (2007), p. 411.Google Scholar
[4] Klein, C. A. J Appl Phys 39 (1968), p. 2029.Google Scholar
[5] Yoon, H. P., Yoon, Y. acknowledge support under the Cooperative Research Agreement between the University of Maryland and the National Institute of Standards and Technology Center for Nanoscale Science and Technology, award 70NANB10H193, through the University of Maryland.Google Scholar