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Energy resolution at the Fano limit: The benefits of the principle of sideward depletion for solid state X-ray spectrometry

Published online by Cambridge University Press:  01 August 2018

Julia Schmidt
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Jeffrey M. Davis
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Martin Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Robert Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Heike Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Lothar Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany University of Siegen, Walter-Flex-Strasse 3, 57072 Siegen, Germany
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Abstract

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© Microscopy Society of America 2018 

References

[1] Gatti, E Rehak, P Nuclear Instruments and Methods in Physics Research 225 1984) p. 608.CrossRefGoogle Scholar
[2] Striider, L, et al, Review of Scientific Instruments 68 1997) p. 4271.CrossRefGoogle Scholar
[3] Lutz, G, et al, Sensors 16 2016) p. 608.CrossRefGoogle Scholar
[4] Lutz, G in “Semiconductor Radiation Detectors” (Springer Publishing, Heidelberg) p.126.Google Scholar
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Energy resolution at the Fano limit: The benefits of the principle of sideward depletion for solid state X-ray spectrometry
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