Hostname: page-component-76fb5796d-x4r87 Total loading time: 0 Render date: 2024-04-27T18:28:04.332Z Has data issue: false hasContentIssue false

First Light on the Argonne PicoProbe and The X-ray Perimeter Array Detector (XPAD)

Published online by Cambridge University Press:  30 July 2021

Nestor Zaluzec*
Affiliation:
Argonne National Laboratory / Photon Science Directorate, Bolingbrook, Illinois, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Fitzgerald, R., Keil, K. & Heinrich, K.F.J.;(1968). Science 159(3814), 528530.CrossRefGoogle Scholar
Lorimer, G.W., Razik, N.A. & Cliff, G.; (1973). J Microsc 99, 153164.CrossRefGoogle Scholar
Zaluzec, N.J.; (1991) Proc. of Microbeam Analysis Society, San Francisco Press, 137Google Scholar
Lyman, C.E., Goldstein, J.I.,Williams, D.B., Ackland, D.W., von Harrach, H.S., Nicholls, A.W., Statham, P.J.; (1994) J Microsc 176, 85Google Scholar
Gatti, E., Rehak, P.; (1984), Nucl. Instr. And Meth. In Phys. Res. 225 608.Google Scholar
Chen, W., et al. , (1992) ; IEEE Trans. on Nucl. Sci. V39, 619.Google Scholar
Iwanczyk, J.S., et al. ; (1996), Nucl. Instr. & Meth. in Phys. Res. A380 (1996) 288CrossRefGoogle Scholar
Iwanczyk, J.S., Patt, B.E., Tull, C.R., Barkan, S., (2001), Micro. Microanal. 7, S2 1052CrossRefGoogle Scholar
Barkan, S., et al. ; (2004); Microscopy Today, 12, (6), 36,CrossRefGoogle Scholar
Watanabe, M., Wade, C.A. (2013)., Microsc Microanal 19, S2, 1264Google Scholar
Tordoff, B., Beam, S., Schweitzer, M., Hill, E., Kugler, V. & Png, K. (2012). Proc. EMC-2012, Manchester, September, PS2.2.Google Scholar
von Harrach, H.S., Dona, P., Freitag, B., Soltau, H., Niculae, A. & Rohde, M. (2009). Microsc Microanal 15(S2), 208209.CrossRefGoogle Scholar
Zaluzec, N.J.; (2004), Micro. Microanal., 10, S2, 122CrossRefGoogle Scholar
Zaluzec, N.J. (2009). Microscopy Today 17(4), 56.CrossRefGoogle Scholar
Argonne National Laboratory. (2010). US Patent 8,314,386Google Scholar
See the WWW sites of leading manufacturers of electron microscopes and x-ray systems.Google Scholar
Zaluzec, N.J., Wen, J., Wang, J., Miller, D.J.; (2016), Microsc. Microanal. 22, S3, 278CrossRefGoogle Scholar
Zaluzec, N.J. (2019) Ultramicroscopy V203 163CrossRefGoogle Scholar
Zaluzec, N.J.; Proc. of EMAG 2021, Manchester UK July 2021 in pressGoogle Scholar
Acknowledgements; This work was supported by the Photon Science Directorate and Laboratory Directed Research and Development (LDRD) funding from Argonne National Laboratory, provided by the Director, as well as the Office of Science, of the U.S. Department of Energy under Contract No. DE-AC02-06CH11357. It was also supported in part by CRADA #01300701 between Argonne National Laboratory and ThermoFisher Scientific Instruments.Google Scholar