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Focused Ion Beam as a Nanofabrication Tool for Rapid Prototyping of Nanomagnetic Devices

  • S Khizroev (a1), A Lavrenov (a1), N Amos (a1), R Chomko (a1) and D Litvinov (a2)...
Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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