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High Spatial Resolution XPS and AES Applications in Understanding Microscopic Surface Phenomena

Published online by Cambridge University Press:  31 July 2006

H Piao  and
L Le Tarte
H Piao
Affiliation:
GE Global Research Center
L Le Tarte
Affiliation:
GE Global Research Center

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1208 - 1209
Copyright
© 2006 Microscopy Society of America