Hostname: page-component-848d4c4894-2pzkn Total loading time: 0 Render date: 2024-05-07T03:47:39.486Z Has data issue: false hasContentIssue false
  • English
  • Français

Identifying Nanometer-scale Clustering in InAlAsSb Random Alloys Using Atom Probe Tomography

Published online by Cambridge University Press:  04 August 2017

Nicole A. Kotulak ,
Keith Knipling ,
Louise C. Hirst ,
Stephanie Tomasulo ,
Josh Abell ,
Maria Gonzalez ,
Michael K. Yakes ,
Jerry R. Meyer  and
Robert J. Walters
Nicole A. Kotulak
Affiliation:
NRC Postdoctoral Associate residing at the U.S. Naval Research Laboratory, Washington, DC 20375U.SA
Keith Knipling
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375USA
Louise C. Hirst
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375USA
Stephanie Tomasulo
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375USA
Josh Abell
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375USA
Maria Gonzalez
Affiliation:
Sotera Defense Solutions, Inc., Herndon, VA 20171USA
Michael K. Yakes
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375USA
Jerry R. Meyer
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375USA
Robert J. Walters
Affiliation:
U.S. Naval Research Laboratory, Washington, DC 20375USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 718 - 719
Copyright
© Microscopy Society of America 2017 

References

References:

[1] Walters, R. J., et al., Proceedings of 37th IEEE PVSC (2011) p. 000122.Google Scholar
[2] Lumb, M. P., et al., Proceedings of SPIE (2012) p. 8256.Google Scholar
[3] Hirst, L. C., et al, J. Appl. Phys 117 2015). p. 215704.Google Scholar
[4] Gonzalez, M., et al., Proceedings of 42nd IEEE PVSC 2015.Google Scholar
[5] Tomasulo, S., et al., Proceedings of 42nd IEEE PVSC (2015).Google Scholar
[6] Balades, N., et al, Applied Surface Science 395 2017). p. 98.Google Scholar
[7] Hernandez-Saz, J., et al, Nanotechnology 27 2016). p. 305402.CrossRefGoogle Scholar
[8] This research was performed while the author held an NRC Research Associateship award at the U.S. Naval Research laboratory.Google Scholar