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In situ electrical testing of device-relevant nanocontacts in the transmission electron microscope

  • Daan Hein Alsem (a1), Siddharth Sood (a1), Norman Salmon (a1) and Tevis D. B. Jacobs (a2)
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Abstract
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References
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[1] Park, JY, et al, Materials today 38 (2010). p. 38.
[2] Cen, C, et al, Nature Materials 7 (2008). p. 298.
[3] Loh, OY & Espinosa, HD Nature Nanotechnology 7 (2012). p. 283.
[4] Agrait, N, Yeyati, AL & van Ruitenbeek, JM Physics Reports 377 (2003). p. 81.
[5] Ohnishi, H, Kondo, Y & Takayanagi, K Nature 395 (1998). p. 780.
[6] Lantz, MA, O’Shea, SJ & Welland, ME Review of scientific instruments 69 (1998). p. 1757.
[7] Wiesendanger, Scanning Probe Microscopy and Spectroscopy. Cambridge U. Press (1994).
[8] Ashcroft & Mermin Solid State Physics. Brooks Cole (1976).
[9] Haynes, WM ed CRC handbook of chemistry and physics. CRC press (2014).
[10] T.D.B.J. acknowledges support from National Science Foundation under award No. #CMMI-1536800.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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