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Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement

  • Hidekazu Takano (a1), Yukinori Nagatani (a2), Songzhe Lian (a3), Koh Hashimoto (a1), Yanlin Wu (a1) and Atsushi Momose (a1)...
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[1] Yashiro, W., et al, Phys Rev Lett 103 2009 180801.
[2] Kuwabara, H., et al, Appl. Phys. Express 4 2011 062502.
[3] Takano, H., et al, Proc. SPIE 10391 2017 1039110.
[4] This work was supported by JST ERATO (grant No. JPMJER1403). The authors thank Carl Zeiss X-Ray Microscopy Inc. (Pleasanton, CA, USA) for help in installing the grating interferometer into the ZEISS Xradia 800 Ultra X-ray microscope.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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