Hostname: page-component-848d4c4894-75dct Total loading time: 0 Render date: 2024-05-13T02:50:48.400Z Has data issue: false hasContentIssue false
  • English
  • Français

Joy of Scanning with Electron and X-ray Imaging

Published online by Cambridge University Press:  01 August 2018

Philippe T. Pinard ,
Simon Burgess ,
Anthony Hyde ,
James Holland  and
Peter Statham
Philippe T. Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Anthony Hyde
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
James Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 624 - 625
Copyright
© Microscopy Society of America 2018 

References

[1] Statham, P, et al, Microsc. Microanal. 19(S2 2013) p. 752.Google Scholar
[2] Statham, P Microsc. Microanal. 19(S2 2013) p. 1292.Google Scholar