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Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector

Published online by Cambridge University Press:  01 August 2018

Ryusuke Sagawa
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Hiroki Hashiguchi
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Thomas Isabell
Affiliation:
JEOL USA Inc., Boston, USA
Robert Ritz
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Martin Simson
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Martin Huth
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Heike Soltau
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Gerardo T. Martinez
Affiliation:
PNDetector GmbH, Munchen, Germany
Peter D. Nellist
Affiliation:
PNDetector GmbH, Munchen, Germany
Yukihito Kondo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
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Abstract

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Copyright
© Microscopy Society of America 2018 

References

[1] Shibata, N., et al, J. Electron Microsc. 59 2010) p. 473.CrossRefGoogle Scholar
[2] Shibata, N., et al, Nature Physics 8 2012) p. 611.CrossRefGoogle Scholar
[3] Ryll, H., et al, J. Instrum. 11 2016) p. 04006.CrossRefGoogle Scholar
[4] Sagawa, R., et al, Microsc. Microanal. 23 2017) p. 52.CrossRefGoogle Scholar
[5] Nellist, P. D., McCallum, B. C. Rodenburg, J. M. Nature 374 1995) p. 630.CrossRefGoogle Scholar
[6] Pennycook, T. J., et al, Ultramicroscopy 151 2015) p. 160.CrossRefGoogle Scholar
[7] Yang, H., et al, Nature Communications 7 2016) p. 12532.CrossRefGoogle Scholar
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