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Multivariate Statistical Analysis of Series of Diffraction Patterns

Published online by Cambridge University Press:  25 July 2016

P.G. Kotula
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886, USA
M.H. Van Benthem
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886, USA
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
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Abstract

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Copyright
© Microscopy Society of America 2016 

References

[1] Mott, R.B. & Friel, J.J. (1999). J Microsc-Oxford 193, 214.CrossRefGoogle Scholar
[2] Schwartz, A.J., et al.. (2000). Electron Backscatter Diffraction in Materials Science. Kluwer Academic, New York.CrossRefGoogle Scholar
[3] Kotula, P.G., Keenan, M.R. & Michael, J.R. (2003). Microsc Microanal 9, 117.CrossRefGoogle Scholar
[4] Brewer, L.N., Kotula, P.G. & Michael, J.R. (2008). Ultramicroscopy 108, 567578.CrossRefGoogle Scholar
[5] Rauch, E.F. & Veron, M. (2005). Mat.-wiss. u. Werkstofftech 36, 552556.CrossRefGoogle Scholar
[6] Rauch, E.F., et al. (2010). Z. Kristallogr 225, 103109.CrossRefGoogle Scholar
[7] Ryll, H., et al. (2013). Microscopy and Microanalysis 19, 11601161.CrossRefGoogle Scholar
[8] Keenan, M.R. (2009). Surf. Int. Anal 41, 7987.CrossRefGoogle Scholar
[9] Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the US Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar
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