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Quantitative Analysis of Electron Beam-Induced Destruction of Graphene Membranes under an Electron Microscope

  • F. Eder (a1), J.C. Meyer (a1), S. Kurasch (a2), U. Kaiser (a2), V. Skakalova (a3), J. Kotakoski (a4), A.V. Krashenninikov (a5) and A. Chuvilin (a6)...

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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