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Quantitative Measurement and Utilization of Electron Irradiation Effects in 2D Materials

Published online by Cambridge University Press:  30 July 2020

Gregor Leuthner
Affiliation:
University of Vienna, Vienna, Wien, Austria
Thuy An Bui
Affiliation:
University of Vienna, Vienna, Wien, Austria
Georg Zagler
Affiliation:
University of Vienna, Vienna, Wien, Austria
Bernhard Fickl
Affiliation:
University of Vienna, Vienna, Wien, Austria
Mohammad Monazam
Affiliation:
University of Vienna, Vienna, Wien, Austria
Alexandru Chirita
Affiliation:
University of Vienna, Vienna, Wien, Austria
Toma Susi
Affiliation:
University of Vienna, Vienna, Wien, Austria
Jani Kotakoski
Affiliation:
University of Vienna, Vienna, Wien, Austria
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Abstract

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Type
New Frontiers in Electron Microscopy of Two-Dimensional Materials
Copyright
Copyright © Microscopy Society of America 2020

References

Susi, , Meyer, , Kotakoski, , Nat. Rev. Phys. 1, 397 (2019)10.1038/s42254-019-0058-yCrossRefGoogle Scholar
Meyer, et al. Phys. Rev. Lett. 108, 196102 (2012)10.1103/PhysRevLett.108.196102CrossRefGoogle Scholar
Susi, et al. Nat. Commun. 7, 13040 (2016)10.1038/ncomms13040CrossRefGoogle Scholar
Cretu, , Lin, , Suenaga, , Micron 72, 2127 (2015)10.1016/j.micron.2015.02.002CrossRefGoogle Scholar
Zagler, et al. , arXiv:1909.06372 (2019)Google Scholar
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