Skip to main content Accessibility help
×
Home

Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns

  • Stuart I. Wright (a1), Saransh Singh (a2) (a3) and Marc De Graef (a3)

Abstract

We propose a new methodology for ranking the reflectors used in traditional Hough-based indexing of electron backscatter diffraction (EBSD) patterns. Instead of kinematic X-ray or electron structure factors (Fhkl) currently utilized, we propose the integrated Kikuchi band intensity parameter (βhkl) based on integrated dynamical electron backscatter intensities. The proposed parameter is compared with the traditional kinematical intensity, $I_{hkl}^{{\rm kin}} $ , as well as the average Hough transform peak intensity, $I_{hkl}^{{\rm HSP}} $ and used to index EBSD patterns for a number of different material systems of varying unit cell complexities including nickel, silicon, rutile, and forsterite. For elemental structures, βhkl closely follows the kinematical ranking. However, significant ranking differences arise for more complex unit cells, with the βhkl parameter showing a better correlation with the integrated Hough intensities. Finally, Hough-based indexing of a simulated forsterite data set showed an appreciable improvement in the median confidence index (0.15 to 0.35) when βhkl is used instead of $I_{hkl}^{{\rm kin}} $ for ranking the reflectors.

Copyright

Corresponding author

*Author for correspondence: Marc De Graef, E-mail: degraef@cmu.edu

References

Hide All
Callahan, P & De Graef, M (2013). Dynamical EBSD patterns part I: Pattern simulations. Microsc Microanal 19, 12551265.
Day, A (2008). Spherical EBSD. J Microsc 230, 472486.
De Graef, M (2003). Introduction to Conventional Transmission Electron Microscopy, Cambridge, UK: Cambridge University Press.
Doyle, P & Turner, P (1968). Relativistic Hartree-Fock X-ray and electron scattering factors. Acta Cryst 24, 390397.10.1107/S0567739468000756
Fox, A, O'Keefe, M & Tabbernor, M (1989). Relativistic Hartree-Fock X-ray and electron atomic scattering factors at high angles. Acta Cryst A 45, 786793.
Hall, C & Hirsch, P (1965). The effect of thermal diffuse scattering on propagation of high energy electrons through crystals. Proc R Soc A 286, 158177.
Kirkland, E (1998). Advanced Computing in Electron Microscopy. New York: Plenum Press.
Krieger, N (1992). Image processing procedures for analysis of electron backscattering patterns. Scanning Microsc 6, 115121.
Krieger Lassen, N (1994). Automated determination of crystal orientations from electron backscattering patterns. PhD Thesis. The Technical University of Denmark.
Lobato, I & Van Dyck, D (2014). An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints. Acta Cryst A 70, 636649.
Maurice, C, Dzieciol, K & Fortunier, R (2011). A method for accurate localisation of EBSD pattern centres. Ultramicroscopy 111, 140148.
Michael, J (2000). Phase identification using electron backscatter diffraction in scanning electron microscope. In Electron Backscatter Diffraction in Materials Science, Schwartz, A, Kumar, M & Adams, B (Eds.), pp. 7589. New York: Kluwer Academic/Plenum Publishers.
Rez, D, Rez, P & Grant, I (1994). Dirac-Fock calculations of X-ray scattering factors and contributions to the mean inner potential for electron scattering. Acta Cryst A 50, 481497.
Roşca, D (2010). New uniform grids on the sphere. Astron Astrophys 520, A63.
Singh, S & De Graef, M (2016). Orientation sampling for dictionary-based diffraction pattern indexing methods. Modell Simul Mater Sci Eng 24, 085013.
Smith, G & Burge, R (1962). The analytical representation of atomic scattering amplitudes for electrons. Acta Cryst A15, 182186.
Weickenmeier, A & Kohl, H (1991). Computation of absorptive form factors for high-energy electron diffraction. Acta Cryst A 47, 590597.
Winkelmann, A (2008). Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction. Ultramicroscopy 108, 1546–1510.
Winkelmann, A (2009). Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction. J Microsc 239, 3245.
Wright, S (2000). Fundamentals in automated EBSD. Electron Backscatter Diffraction in Materials Science, Schwartz, A, Kumar, M & Adams, B (Eds.), pp. 5161, New York: Kluwer Academic/Plenum Publishers.

Keywords

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed