Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis

Pawel Nowakowski; James Schlenker; Mary Ray; Paul Fischione

doi:10.1017/S143192761600091X

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Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Nowakowski, P. Ray, M.L. and Fischione, P.E. 2017. Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 12.

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Lambert, P. K. Hustedt, C. J. Casem, D. T. Sinclair, N. Zhang, X. J. Lee, K. M. Leong, A. F. T. Schuster, B. E. and Hufnagel, T. C. 2020. Strain-Rate Dependence of the Martensitic Transformation Behavior in a 10 Pct Ni Multi-phase Steel Under Compression. Metallurgical and Materials Transactions A, Vol. 51, Issue. 10, p. 5101.

Nowakowski, Pawel Ray, Mary and Fischione, Paul 2020. Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials. Microscopy and Microanalysis, Vol. 26, Issue. S2, p. 1982.

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Wolff, Annalena 2021. Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?. Beilstein Journal of Nanotechnology, Vol. 12, Issue. , p. 965.

Palasse, Laurie and Nowakowski, Pawel 2021. Advances in EBSD sample preparation by broad ion beam milling. Microscopy and Microanalysis, Vol. 27, Issue. S1, p. 1836.

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Nowakowski, Pawel Ray, Mary and Fischione, Paul 2022. Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements. Microscopy and Microanalysis, Vol. 28, Issue. S1, p. 768.

Nowakowski, Pawel Bonifacio, Cecile Ray, Mary and Fischione, Paul 2023. Developments in Broad Ion Beam Milling Sample Preparation Instrumentation for Microscopy and Microanalysis Applications. Microscopy and Microanalysis, Vol. 29, Issue. Supplement_1, p. 2075.

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Lee, Sangwon Berman, Tracy D. Yildirim, Can Detlefs, Carsten Allison, John E. and Bucsek, Ashley 2024. Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction. Scientific Reports, Vol. 14, Issue. 1,

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Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis

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