Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-05-11T22:00:56.621Z Has data issue: false hasContentIssue false
  • English
  • Français

Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries

Published online by Cambridge University Press:  25 July 2016

Adam Stokes ,
Mowafak Al-Jassim  and
Brian Gorman
Adam Stokes
Affiliation:
Colorado School of Mines, Material Science, Golden, COUSA. National Renewable Energy Laboratory, National Center for Photovoltaics, Golden CO, USA.
Mowafak Al-Jassim
Affiliation:
National Renewable Energy Laboratory, National Center for Photovoltaics, Golden CO, USA.
Brian Gorman
Affiliation:
Colorado School of Mines, Material Science, Golden, COUSA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 644 - 645
Copyright
© Microscopy Society of America 2016 

References

[1] Green, M. A., et al., Progress in Photovoltaics (pp 1–9, 2015.Google Scholar
[2] Choi, P.-P., et al., J. Appl. Phys. vol. 110(no. 12 p. 124513 (2011).CrossRefGoogle Scholar
[3] Cojocaru-mir, O., et al., IEEE J. Photovoltaics vol. 1 no. 2, pp.207–212, 2011.CrossRefGoogle Scholar
[4] Keller, J., et al., Sol. Energy Mater. Sol. Cells vol. 117, pp 592–598, Oct. 2013.CrossRefGoogle Scholar
[5] Thompson, K., et al., Ultramicroscopy vol. 107 no. 2-3, pp.131–139, 2007.Google Scholar
[6] Gorman, B. P., et al., Microscopy Today 16, pp 42–48, 2008.CrossRefGoogle Scholar