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Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future

Published online by Cambridge University Press:  01 August 2018

A. Liebel
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
A. Schöning
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
A. Bechteler
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
K. Hermenau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
K. Heinzinger
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
L. Strüder
Affiliation:
University of Siegen, Department of Physics, Walter-Flex-Str. 3, 57068Siegen, Germany
A. Niculae
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
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Abstract

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Copyright
© Microscopy Society of America 2018 

References

[1] Strüder, L, et al, Microscopy & Microanalysis volume 4 1999) pp. 622631.CrossRefGoogle Scholar
[2] Niculae, A, et al, Proceedings of Microscopy & Microanalysis volume 22(S3 2016) pp. 4243.CrossRefGoogle Scholar
[3] Schlossmacher, P, et al, Microscopy Today vol. 18(4 2010) pp. 1420.CrossRefGoogle Scholar
[4] von Harrach, HS, et al, Journal of Physics Conference Series volume 241(1), ( 2010.Google Scholar
[5] Niculae, A, et al, Proceedings of Microscopy & Microanalysis volume 22(S3 2016) pp. 4041.CrossRefGoogle Scholar
[6] Bombelli, L., et al, IEEE Nuclear Science Symposium Conference (NSS/MIC), ISBN 978-1-42449105-6 (2010).Google Scholar
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