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Structural and Magnetic Characterization of B20 Skyrmion Thin Films and Heterostructures Using Aberration-Corrected Lorentz TEM and Differential Phase Contrast STEM

  • B. D. Esser (a1), A. S. Ahmed (a2), R. K. Kawakami (a2) and D. W. McComb (a1)
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References
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[1] Langner, M. C., et al, Physical Review Letters 112, 167202 2014.
[2] Schulz, T., et al, Nature Physics 8, 301 2012.
[3] Milde, P., et al, Science 340, 1076 2013.
[4] Woo, S., et al, Nature Materials 15, 501506, 2016.
[5] Ahmed, A. S., et al., arXiv:1702.05191 (2017).
[6] Funding for this research was provided by the Center for Emergent Materials at the Ohio State University, an NSF MRSEC (Award Number DMR-1420451), as well as from the Ohio State Materials Seed Grants (MTB-G00010 and MTB-G00012).
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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