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TEM Investigation of GeO2 Concentration Profiles in GeO2-SiO2 Soot Particles from Preforms of Outside Vapor Deposition

Published online by Cambridge University Press:  01 August 2005

S-C Cheng
Affiliation:
Corning Incorporated
J Liu
Affiliation:
Corning Incorporated

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Copyright
© 2005 Microscopy Society of America