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    This article has been cited by the following publications. This list is generated based on data provided by CrossRef.

    DAVIES, SIWAN M. 2015. Cryptotephras: the revolution in correlation and precision dating. Journal of Quaternary Science, Vol. 30, Issue. 2, p. 114.


    ZANDER, PAUL D. KAUFMAN, DARRELL S. KUEHN, STEPHEN C. WALLACE, KRISTI L. and ANDERSON, R. SCOTT 2013. Early and late Holocene glacial fluctuations and tephrostratigraphy, Cabin Lake, Alaska. Journal of Quaternary Science, Vol. 28, Issue. 8, p. 761.


    Lowe, David J. 2011. Tephrochronology and its application: A review. Quaternary Geochronology, Vol. 6, Issue. 2, p. 107.


    Pearce, Nicholas J.G. Perkins, William T. Westgate, John A. and Wade, Stephen C. 2011. Trace-element microanalysis by LA-ICP-MS: The quest for comprehensive chemical characterisation of single, sub-10 μm volcanic glass shards. Quaternary International, Vol. 246, Issue. 1-2, p. 57.


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Tephra from Ice—A Simple Method to Routinely Mount, Polish, and Quantitatively Analyze Sparse Fine Particles

  • Stephen C. Kuehn (a1) and Duane G. Froese (a1)
  • DOI: http://dx.doi.org/10.1017/S1431927609991322
  • Published online: 01 January 2010
Abstract
Abstract

A method involving a graphite substrate has been developed for the mounting and analysis of sparse, fine particles from a liquid suspension to enable improved study of volcanic ash (tephra) and atmospheric dust preserved in glacial ice. Unpolished grains may be studied by scanning electron microscope–energy dispersive spectrometry (SEM-EDS) at full vacuum without the need for a conductive coating due to the close proximity of the underlying graphite. The same grains in the same relative positions may be subsequently examined in polished mounts by a variety of methods including SEM-EDS, electron probe microanalysis, laser ablation–inductively coupled plasma–mass spectroscopy, secondary ion mass spectrometry, and optical microscopy. Particles as small as 3–5 μm may be routinely and easily prepared for analysis as polished grains, and particles of significantly different sizes may be exposed simultaneously. The general approach also offers significant flexibility, including both single- and multiple-sample mounts, and may be adjusted to suit a variety of samples and analytical methods.

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Corresponding author. E-mail: kuehns@wlu.edu
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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