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Understanding and Exploiting the Interaction of Electron Beams With Low-dimensional Materials - From Controlled Atomic-level Manipulation to Circumventing Radiation Damage

  • T. Susi (a1), A. Mittelberger (a1), C. Kramberger (a1), C. Mangier (a1), C. Hofer (a1), T.J. Pennycook (a1), J. Kotakoski (a1) and J. C. Meyer (a1)...
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References
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[1] Egerton RF, Li P & Malac M Micron 35 2004). p. 399.
[2] Meyer JC, et al, Phys. Rev. Lett. 108 2012). p. 196102.
[3] Kotakoski J, Mangier C & Meyer J Nat. Comm. 5 2014). p. 3991.
[4] Susi T, et al, Phys. Rev. Lett. 113 2014). p. 115501.
[5] Susi T, et al, 2D materials, in press (http://doi.org/10.1088/2053-1583/aa5e78).
[6] Meyer JC, et al, Nat. Mat. 10 2011). p. 209. T. Susi et al, ACS Nano 6 (2012), p. 8837.
[7] Kramberger C & Meyer J Ultramic. 170 2016). p. 60. JC Meyer et al, Ultramic. 145 (2014) p. 13.
[8] The authors acknowledge funding from the European Research Council (ERC) project PICOMAT, the Austrian Science Fund (FWF) projects P25721-N20 and P 28322-N36, and the Wiener Wissenschafts- Forschungs- und Technologiefonds (WWTF) via project MA14-009.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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