Microscopy and Microanalysis: Volume 13 - Issue S02

Volume 13 - Issue S02 - August 2007

Contents

Page 44 of 44

Virtual SEM (VSEM) - Evaluation of a Teaching and Training Tool
MGC Martin, DD M Holburn, DN H M Caldwell, MB C Bernie
Published online by Cambridge University Press:

05 August 2007, pp. 1724-1725
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Database Solution to Particle-by-Particle Analysis of Mixed Mineral Dusts
KE Harris, KL Bunker, R Hoch, RJ Lee
Published online by Cambridge University Press:

05 August 2007, pp. 1726-1727
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Comparison of Materials Characterization Performed by Low Voltage Desktop SEM and Standard High Resolution SEM
J Lawrance, J Carruthers, J Jiao, S Berger
Published online by Cambridge University Press:

05 August 2007, pp. 1728-1729
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Electron Microscopy Database: A Resource for Teaching and Learning Quantitative Methods in Electron Microscopy and Spectroscopy
P Voyles, J Yang, J-M Zuo, S Stemmer
Published online by Cambridge University Press:

05 August 2007, pp. 1730-1731
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Effect of Cleaning Parameters on Cleaning Effectiveness in an SEM Equipped with an RF Plasma Anti-Contamination Device
R Garcia, AD Batchelor, CB Mooney, AD Garetto, R Vane, DP Griffis
Published online by Cambridge University Press:

05 August 2007, pp. 1732-1733
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Using a Thickness Monitor to Measure Contaminant Removal by Evactron Cleaning as a Function of Operating Parameters
MM Gleason, CG Morgan, R Vane
Published online by Cambridge University Press:

05 August 2007, pp. 1734-1735
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Quantification of Contamination Using Quartz Thickness Monitors
CG Morgan, MM Gleason, R Vane
Published online by Cambridge University Press:

05 August 2007, pp. 1736-1737
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Effect of Collimators on Evactron Cleaning of EDS Detector Windows
CG Morgan, MM Gleason, R Vane
Published online by Cambridge University Press:

05 August 2007, pp. 1738-1739
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 44 of 44