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Volume 15 - Supplement S2 - July 2009

Contents

Page 9 of 39

Instrumentation and Techniques

Focused Ion Beam (FIB) Science and Technology: Fundamental Interactions,Instrumentation and Applications

Abstract

  • Applications for Argon in a Triple Beam

  • T Fujii, H Suzuki, X Man, M Hassel Shearer, M Takahashi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 322-323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Surface Area Determination of Metal Ceramic Composite by FIB Sectioning and BET Measurements

  • M Lundberg, P Stanley Jørgensen, JR Bowen, Å Persson, AK Srivastava, S Ramousse
  • Published online by Cambridge University Press:
    26 July 2009, pp. 324-325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Experimental Determination of Electron Inelastic Mean Free Path of Components in a Magnetic Read Head

  • X Xu, L Vinh, J Risner-Jamtgaard, D Yaney
  • Published online by Cambridge University Press:
    26 July 2009, pp. 326-327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond

  • W McKenzie, J Pethica, G Cross
  • Published online by Cambridge University Press:
    26 July 2009, pp. 328-329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Precision, Double XTEM Sample Preparation of Site Specific Si Nanowires

  • LM Gignac, S Mittal, S Bangsaruntip, GM Cohen, JW Sleight
  • Published online by Cambridge University Press:
    26 July 2009, pp. 330-331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Advantages of a Local Charge Compensation System for FIB/SEM Applications on Insulating Materials

  • H Schulz, U Zeile, JP Stodolka, D Kraft
  • Published online by Cambridge University Press:
    26 July 2009, pp. 332-333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Backside TEM Sample Preparation With The Multi-Loader Flip-Stage

  • A Buxbaum, R Schampers, J-J Bolt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 334-335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens

  • B Van Leer, LA Giannuzzi, Y-C Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 336-337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Dislocation Analysis of Semiconductor Devices using 3D Rotation Imaging Technique of Dedicated STEM

  • TS Back, SJ Lee, JW Jung, JH Kim, HJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 338-339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Standard Free Thickness Determination of Thin TEM Samples via Backscatter Electron Image Correlation

  • R Salzer, A Graff, M Simon, F Altmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 340-341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applications of SEM/FIB Technology in Life Science

  • A Schertel, D Kraft, M Rauscher
  • Published online by Cambridge University Press:
    26 July 2009, pp. 344-345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Focused Ion Beam-based Three Dimensional Analysis of Optic Nerve Axons

  • A Avishai, X Yin, B Trapp, G Kidd
  • Published online by Cambridge University Press:
    26 July 2009, pp. 346-347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanomilling for Aberration – Corrected TEM and HAADF STEM

  • RR Cerchiara, PE Fischione, J Liu, JM Matesa, AC Robins, HL Fraser, A Genc
  • Published online by Cambridge University Press:
    26 July 2009, pp. 348-349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Toward Nanomagnetomechanical Systems Focused Ion Beam Milling of Ferromagnetic Garnets

  • D Vick, A Fraser, V Sauer, W Hiebert, M Freeman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 350-351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars

  • N Mara, D Bhattacharyya, P Dickerson, R Hoagland, A Misra
  • Published online by Cambridge University Press:
    26 July 2009, pp. 352-353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • FIB/SEM Fabrication of Nanostructures for Plasmonic Sensors and Waveguides

  • A Madison, A Dhawan, M Gerhold, T Vo-Dinh, PE Russell, DN Leonard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 354-355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanofabrication of Multi-Layer Devices and Multiple Writing Fields Using Focused Ion Beam and DualBeam™ Instruments

  • O Wilhelmi, A Rosenthal, P Faber, F Morrissey, LY Roussel
  • Published online by Cambridge University Press:
    26 July 2009, pp. 356-357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Damage Layers in Si vs. Ion Dose during 30 keV FIB Milling

  • S Rubanov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 358-359
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Optimized Sample Preparation for the Imaging of Silicon Defects using Plan View Transmission Electron Microscopy

  • N Wang, A Myers, M Sidorov, H Koo, C Yuan, B Tracy, S Li
  • Published online by Cambridge University Press:
    26 July 2009, pp. 360-361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 9 of 39