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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 47 of 52

Physical Sciences

P06.02 Failure Analysis of Structural Materials: Microscopy, Metallography and Fractography

Abstract

  • Computer Tomography, a useful Instrument for Failure Analyses

  • M. Panzenboeck, M. Borchert
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1840-1841
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P06.03 Failure Analysis of Structural Materials: Microscopy, Metallography and Fractography

Abstract

  • Characterization of Degradation and Failure Modes in Lithium-ion Cells

  • Q. Horn, K. White
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1842-1843
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Three Pipe Corrosion Failure Cases

  • A. Havics
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1844-1845
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Distribution of helium bubbles in Al/B4C MMC irradiated with 400keV He+ ions

  • F. Zhang, G. Yu, C. Lu, X. Wang, L. Wang
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1846-1847
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Structural Analysis of Branched Boron Carbide Nanostructures

  • B. Cao, Z. Guan, T. Xu
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1848-1849
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Influence of ion beam damage by FIB on the RESET amorphous volume observation in phase change random access memory device

  • J. Oh, Y. Jang, S. Jeon, T. Lee, W. Kim, H. Kim, C. Kim
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1850-1851
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P06.P1 Failure Analysis of Structural Materials: Microscopy, Metallography and Fractography

Abstract

  • Failure Analysis and Quantitative Image Analysis of Leaded Brass Components

  • D.F. Susan, A.C. Kilgo, R.P. Grant, G.D. Grimm
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1854-1855
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • On the Study of the Orientated Cracks Formed in ErD2 Thin Film

  • H. Shen, K. Sun, X. Xiang, X. Zu
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1856-1857
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • TEM Investigation of Implanted Ag Distribution in PyC and SiC after Annealing

  • G. Yu, S. Dwaraknath, G. Ran, G. Was, L. Wang
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1860-1861
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P07.01 Special Problems and Solutions: Coatings, Ceramics and Polymers

Abstract

  • Characterization of Coatings with Ions and Electrons

  • L.A. Giannuzzi, N.S. Smith, S. Sampath
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1862-1863
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Benefits of Using a Biological Confocal Microscope to Resolve Difficult and Unusual Problems in Material Science

  • E.J. Sanford
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1864-1865
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microstructural Characterization of a Thermal Barrier Coating System Using SEM, TEM and APT Techniques

  • Y. Chen, R.C. Reed, E.A. Marquis
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1866-1867
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Three-Dimensional Cathodoluminescence by Focused Ion Beam - Scanning Electron Microscopy

  • M. De Winter, G.M. Pennock, J.A. Post, M.R. Drury
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1868-1869
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

P07.02 Special Problems and Solutions: Coatings, Ceramics and Polymers

Abstract

  • Imaging Cellulose Nanocrystals

  • I. Sacui, H. Szmacinski, D.L. Blair, J.S. Urbach, M. Zammarano, J.W. Gilman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1870-1871
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Non-Destructive Measurement of a Combinatorial Materials Library for All-Oxide Solar Cells

  • C. Lang, S. Rühle, A.Y. Anderson, A. Zaban, P. Statham, S. Burgess
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1872-1873
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microstructural Characterization of Ion Implantation Effects in Aluminum Nitride Substrates for Energy-Scavenging Applications

  • F.S. Alleyne, R. Gronsky
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1874-1875
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM

  • T.J. Pennycook, L. Jones, H. Pettersson, V. Nicolosi, P.D. Nellist
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1876-1877
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 47 of 52