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Adhesive-Based Atom Probe Sample Preparation

  • Surya S. Rout (a1) (a2), Philipp R. Heck (a1) (a2) (a3), Nestor J. Zaluzec (a4), Dieter Isheim (a5), Dean J. Miller (a6) and David N. Seidman (a5)...
Abstract

We present a specimen preparation procedure for atom-probe tomography using SemGlu from Kleindiek Nanotechnik, an adhesive that hardens under electron beam irradiation. The SemGlu adhesive is used in place of focused-ion-beam-induced deposition of organo-metallic Pt, W, or C to form a bond between the sample and the substrate during the specimen preparation procedure. We demonstrate the utility of this adhesive-based specimen preparation technique with a correlated atom-probe tomography-scanning transmission electron microscopy study of the iron-nickel alloy kamacite (ferrite, ɑ-iron) in the Bristol iron meteorite and two steel specimens.

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Copyright
Corresponding author
* surya.Rout@space.unibe.ch
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Present Address: Physics Institute, Space Research & Planetary Sciences, University of Bern, Sidlerstrasse 5, 3012 Bern, Switzerland

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References
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Microscopy Today
  • ISSN: 1551-9295
  • EISSN: 2150-3583
  • URL: /core/journals/microscopy-today
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