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Transmission Electron Microscopy Imaging of Structural Transformation Dynamics in a Single Nanocrystal

  • Haimei Zheng (a1)
Abstract

Over the last decade, transmission electron microscopy (TEM) has advanced remarkably. With the development of aberration-corrected optics, improved recording systems, high brightness guns, and so on, imaging with single-atom sensitivity across the periodic table has become a reality. Atomic resolution imaging with rapid acquisition and with greater signal collection efficiency opens many opportunities in the study of dynamic processes of materials.

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Copyright
Corresponding author
hmzheng@lbl.gov
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[1] HM Zheng , JB Rivest , TA Miller , B Sadtler , A Lindenberg , MF Toney , LW Wang , C Kisielowski , and AP Alivisatos , Science 333 (2011) 206–09.

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Microscopy Today
  • ISSN: 1551-9295
  • EISSN: 2150-3583
  • URL: /core/journals/microscopy-today
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