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Use of XPS to Quantify Thickness of Coatings on Nanoparticles

  • Donald R. Baer (a1), Yung-Cheng Wang (a2) and David G. Castner (a2) (a3)
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*don.baer@pnnl.gov
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Microscopy Today
  • ISSN: 1551-9295
  • EISSN: 2150-3583
  • URL: /core/journals/microscopy-today
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