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Higher Order Nonlinear Dielectric Microscopy
Published online by Cambridge University Press: 17 March 2011
Abstract
A higher order nonlinear dielectric microscopy technique with higher lateral and depth resolution than conventional nonlinear dielectric imaging is investigated. The proposed technique involves the measurement of higher order nonlinear dielectric constants, with a depth resolution of down to 1.5 nm. The technique is demonstrated to be very useful for observing surface layers of the order of unit cell thickness on ferroelectric materials.
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- Copyright © Materials Research Society 2002