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Real-time Investigations on the Formation of CuIn(S,Se)2 while annealing precursors with varying sulfur content

  • Astrid Hölzing (a1), Roland Schurr (a2), Stefan Jost (a3), Jörg Palm (a4), Klaus Deseler (a5), Peter J. Wellmann (a6) and Rainer Hock (a7)...


CIS based chalcopyrite absorber materials are usually substituted in the cation and anion lattice to yield mixed pentanary crystals with the general composition Cu(In,Ga)(Se,S)2 to achieve an optimised adaptation of the semiconductor bandgap to the terrestrial solar spectrum. Real-time investigations during the annealing of stacked elemental layers (SEL) of sputtered metals Cu and In and evaporated chalcogens S and Se with varying ratios were performed by angle-dispersive time-resolved XRD (X-ray diffraction) measurements. After qualitative phase analysis the measured powder diagrams were quantitatively analysed by the Rietveld method, the phases formed determined and their reaction kinetics obtained. Ternary indium and copper sulfoselenides form by the sulfoselenisation of the intermetallic alloy yielding different educts for the chalcopyrite formation with varying sulfur content. For S/(S+Se) ≥ 0.5 the formation of the chalcopyrite CuIn(S,Se)2 is similar to the crystallisation path of CuInS2. With increasing amount of selenium (S/(S+Se) = 0.25) different ternary sulfoselenides contribute to the semiconductor formation. For small amounts of sulfur, i.e. S/(S+Se) ≤ 0.1, the chalcopyrite crystallisation proceeds comparable to the one observed for sulfur-free Cu-In-Se precursors. The formation of CuIn(S,Se)2 is accelerated and proceeds mainly after the peritectic decomposition of Cu(S,Se) to Cu2(S,Se). The sulfur content determines the crystallisation temperature of the semiconductor because Cu(S,Se) decomposes at higher temperatures with increasing sulfur. Upon heating S ↔ Se exchange reactions take place in the Cu-S-Se and Cu-In-S-Se system.



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1. Karg, F. Probst, V. Harms, H. Rimmasch, J. Riedl, W. Kotschy, J. Holz, J. Treichler, R. Eibl, O. Mitwalsky, A. and Kiendl, A. Proceedings of the 23rd IEEE Specialists Conference, Louisville (1993) 41446.
2. Palm, J. Probst, V. Stetter, W. Toelle, R. Visbeck, S. Calwer, H. Niesen, T. Vogt, H. Hernandez, O. Wendl, M. and Karg, F. H. Thin Solid Films 451/452, 544551 (2004).
3. Meyer, N. Meeder, A. and Schmid, D. Thin Solid Films 515, 59795984 (2007).
4. Hergert, F. Hock, R. Weber, A. Purwins, M. Palm, J. and Probst, V. J. Phys. Chem. Solids 66(11), 19031907 (2005).
5. Brummer, A. Honkimäki, V., Berwian, P. Probst, V. Palm, J. and Hock, R. Thin Solid Films 437(1-2), 297307 (2003).
6. Wolf, D. Doctoral Thesis, University of Erlangen-Nürnberg, Germany, (1998).
7. Jost, Stefan, Hergert, Frank, Hock, Rainer, Voβ, Torsten, Schulze, Jörg, Kirbs, Andreas, Purwins, Michael, Probst, Volker and Palm, Jörg in Thin-Film Compound Semiconductor Photovoltaics–2007, edited by Gessert, Timothy, Durose, Ken, Heske, Clemens, Marsillac, Sylvain and Wada, Takahiro (Mater. Res. Soc. Symp. 1012, Warrendale, PA, 2007) pp. 335.
8. Jost, S. Schurr, R. Hölzing, A., Hergert, F. Hock, R. Purwins, M. Palm, J. Thin Solid Films 517, 21362139 (2009).
9. Jost, S. Doctoral Thesis, University of Erlangen-Nürnberg, Germany, (2008).
10. Hölzing, A., Schurr, R. Schäfer, H., Jäger, A., Jost, S. Palm, J. Deseler, K. Wellmann, P. Hock, R. Thin Solid Films 517, 22132217 (2009).
11. Klopmann, C. von, Djordjevic, J. Rudigier, E. Scheer, R. J. Cryst. Growth 289, 121133 (2006).
12. Djordjevic, J. Rudigier, E. Scheer, R. J. Cryst. Growth 294, 218230 (2006).
13. Klopmann, C. von, Djordjevic, J. Scheer, R. J. Cryst. Growth 289, 113120 (2006).
14. Djordjevic, J. Pietzker, C. Scheer, R. J. Phys. Chem. Sol. 64, 18431848 (2003).
15. Jost, S. Hergert, F. Hock, R. Purwins, M. Enderle, R. Z. Krist. Suppl. 23, 124 (2006).
16. Jost, S. Hergert, F. Hock, R. Purwins, M. Enderle, R. Phys. Stat. Sol. A 203(11), 25812587 (2006).
17. Vegard, L. Z. Phys. 5, 1726 (1921).
18. Pietzker, C. Doctoral Thesis, University Potsdam, Germany, (2003).



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