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F-42 Quantitative Analysis of Nano-Particle by XRF

Published online by Cambridge University Press:  20 May 2016

T. Utaka ,
N. Kawada ,
K. Taniguchi ,
S. Maeo ,
M. Kurakado ,
Y. Araki ,
K. Muraoka  and
T. Itoh
T. Utaka
Affiliation:
Institute of X-ray Technologies Co. Ltd, Osaka, Japan and Osaka Electro-Communication University, Osaka, Japan
N. Kawada
Affiliation:
Institute of X-ray Technologies Co. Ltd, Osaka, Japan and Osaka Electro-Communication University, Osaka, Japan
K. Taniguchi
Affiliation:
Institute of X-ray Technologies Co. Ltd, Osaka, Japan and Osaka Electro-Communication University, Osaka, Japan
S. Maeo
Affiliation:
Osaka Electro-Communication University, Osaka, Japan
M. Kurakado
Affiliation:
Osaka Electro-Communication University, Osaka, Japan
Y. Araki
Affiliation:
Institute of X-ray Technologies Co. Ltd, Osaka, Japan
K. Muraoka
Affiliation:
Institute of X-ray Technologies Co. Ltd, Osaka, Japan
T. Itoh
Affiliation:
Institute of X-ray Technologies Co. Ltd, Osaka, Japan
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 179
Copyright
Copyright © Cambridge University Press 2008

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