Hostname: page-component-848d4c4894-hfldf Total loading time: 0 Render date: 2024-05-07T02:08:41.465Z Has data issue: false hasContentIssue false

Whither Oxide Electronics?

Published online by Cambridge University Press:  31 January 2011

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

In this issue we have endeavored to answer the question, “Whither oxide electronics?” This issue provides a framework and perspective on the progress in the field of oxide electronics over the past several decades, as well as the challenges and opportunities in the years to come. Building on the foundations laid by the pioneers in the materials community and spurred by the discovery of high-temperature superconductivity, there has been both tremendous progress in understanding the complex science of oxide electronic materials and the discovery of other fascinating new phenomena, including colossal magnetoresistance, multiferrocity, and two-dimensional electron gases in correlated oxide systems. Thin-film heterostructures provide a pathway to create novel devices and combinations of physical phenomena. Indeed, the ability to synthesize and control oxide heterostructures using sophisticated deposition techniques has become a key enabler of the recent advances in this field. These oxides are beginning to enter mainstream products because of their higher performance, for example, ferroelectric memories and oxides with high dielectric constant for computers that run at higher speed and use less power.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

References

1.Mott, N.F., Metal–Insulator Transitions (Taylor & Francis, London, ed. 2, 1990).CrossRefGoogle Scholar
2.von Hippel, A., Breckenridge, R.G., Chesley, F.G., Tisza, L., Ind. Eng. Chem. 38, 1097 (1946).CrossRefGoogle Scholar
3.Goodenough, J.B., in Progress in Solid State Chemistry, Reiss, H., Ed. (Pergamon Press, Oxford, 1971), vol. 5, pp. 145399.Google Scholar
4.Cross, L.E., Ferroelectrics 76, 241 (1987).CrossRefGoogle Scholar
5.Geballe, T.H., MRS Bull. 17 (7), 70 (1992).CrossRefGoogle Scholar
6.Bednorz, J.G., Müller, K.A., Z. Phys. B: Condens. Matter 64, 189 (1986).CrossRefGoogle Scholar
7.Shannon, R.D., Acta Crystallogr. A 32, 751 (1976).CrossRefGoogle Scholar
8.Hazen, R.M., Sci. Am. 258, 52 (1988).CrossRefGoogle Scholar
9.Goodenough, J.B., Demazeau, G., Pouchard, M., Hagenmuller, P., J. Solid State Chem. 8, 325 (1973).CrossRefGoogle Scholar
10.Michel, C., Raveau, B., Rev. Chim. Miner. 21, 407 (1984).Google Scholar
11.Bednorz, J.G., Takashige, M., Müller, K.A., Europhys. Lett. 3, 379 (1987).CrossRefGoogle Scholar
12.Wu, M.K., Ashburn, J.R., Torng, C.J., Hor, P.H., Meng, R.L., Gao, L., Huang, Z.J., Wang, Y.Q., Chu, C.W., Phys. Rev. Lett. 58, 908 (1987).CrossRefGoogle Scholar
13.Cava, R.J., Batlogg, B., van Dover, R.B., Murphy, D.W., Sunshine, S., Siegrist, T., Remeika, J.P., Rietman, E.A., Zahurak, S., Espinosa, G.P., Phys. Rev. Lett. 58, 408 (1987).CrossRefGoogle Scholar
14.Takagi, H., Uchida, S.-I., Kitazawa, K., Tanaka, S., Jpn. J. Appl. Phys., Part 2 26, L123 (1987).CrossRefGoogle Scholar
15.Tokura, Y., Takagi, H., Uchida, S., Nature 337, 345 (1989).CrossRefGoogle Scholar
16.Imada, M., Fujimori, A., Tokura, Y., Rev. Mod. Phys. 70, 1039 (1998).CrossRefGoogle Scholar
17.Dijkkamp, D., Venkatesan, T., Wu, X.D., Shaheen, S.A., Jisrawi, N., Min-Lee, Y.H., McLean, W.L., Croft, M., Appl. Phys. Lett. 51, 619 (1987).CrossRefGoogle Scholar
18.Spah, R.J., Hess, H.F., Stormer, H.L., White, A.E., Short, K.T., Appl. Phys. Lett. 53, 441 (1988).CrossRefGoogle Scholar
19.Schlom, D.G., Eckstein, J.N., Hellman, E.S., Streiffer, S.K., Harris, J.S. Jr., Beasley, M.R., Bravman, J.C., Geballe, T.H., Webb, C., von Dessonneck, K.E., Turner, F., Appl. Phys. Lett. 53, 1660 (1988).CrossRefGoogle Scholar
20.Kwo, J., Hong, M., Trevor, D.J., Fleming, R.M., White, A.E., Farrow, R.C., Kortan, A.R., Short, K.T., Appl. Phys. Lett. 53, 2683 (1988).CrossRefGoogle Scholar
21.Lathrop, D.K., Russek, S.E., Buhrman, R.A., Appl. Phys. Lett. 51, 1554 (1987).CrossRefGoogle Scholar
22.Terashima, T., Iijima, K., Yamamoto, K., Bando, Y., Mazaki, H., Jpn. J. Appl. Phys., Part 2 27, L91 (1988).CrossRefGoogle Scholar
23.Koinuma, H., Kawasaki, M., Funabashi, M., Hasegawa, T., Kishio, K., Kitazawa, K., Fueki, K., Nagata, S., J. Appl. Phys. 62, 1524 (1987).CrossRefGoogle Scholar
24.Poppe, U., Schubert, J., Arons, R.R., Evers, W., Freiburg, C.H., Reichert, W., Schmidt, K., Sybertz, W., Urban, K., Solid State Commun. 66, 661 (1988).CrossRefGoogle Scholar
25.Sandstrom, R.L., Gallagher, W.J., Dinger, T.R., Koch, R.H., Laibowitz, R.B., Kleinsasser, A.W., Gambino, R.J., Bumble, B., Chisholm, M.F., Appl. Phys. Lett. 53, 444 (1988).CrossRefGoogle Scholar
26.Xi, X.X., Linker, G., Meyer, O., Nold, E., Obst, B., Ratzel, F., Smithey, R., Strehlau, B., Weschenfelder, F., Geerk, J., Z. Phys. B: Condens. Matter 74, 13 (1989).CrossRefGoogle Scholar
27.Eom, C.B., Sun, J.Z., Yamamoto, K., Marshall, A.F., Luther, K.E., Geballe, T.H., Laderman, S.S., Appl. Phys. Lett. 55, 595 (1989).CrossRefGoogle Scholar
28.Fujita, J., Yoshitake, T., Kamijo, A., Satoh, T., Igarashi, H., J. Appl. Phys. 64, 1292 (1988).CrossRefGoogle Scholar
29.Schulz, D.L., Marks, T.J., Adv. Mater. 6, 719 (1994).CrossRefGoogle Scholar
30.Scott, J.F., Paz de Araujo, C.A., Science 246, 1400 (1989).CrossRefGoogle Scholar
31.Morton, J.A., “Electrical Switching and Storage,” U.S. Patent 2,791,761 (May 7, 1957).Google Scholar
32.Ramesh, R., Inam, A., Chan, W.K., Wilkens, B., Myers, K., Remschnig, K., Hart, D.L., Tarascon, J.M., Science 252, 944 (1991).CrossRefGoogle Scholar
33.Ramesh, R., Chan, W.K., Wilkens, B., Gilchrist, H., Sands, T., Tarascon, J.M., Keramidas, V.G., Fork, D.K., Lee, J., Safari, A., Appl. Phys. Lett. 61, 1537 (1992).CrossRefGoogle Scholar
34.Ramesh, R., “Cubic Metal Oxide Thin Film Epitaxially Grown on Silicon,” U.S. Patent 5,270,298 (December 14, 1993).Google Scholar
35.Eom, C.B., Cava, R.J., Fleming, R.M., Phillips, J.M., van Dover, R.B., Marshall, J.H., Hsu, J.W.P., Krajewski, J.J., Peck, W.F. Jr.,, Science 258, 1766 (1992).CrossRefGoogle Scholar
36.Cillessen, J.F.M., Wolf, R.M., De Vierman, A.E.M., Appl. Surf. Sci. 69, 212 (1993).CrossRefGoogle Scholar
37.Matthews, S., Ramesh, R., Venkatesan, T., Benedetto, J., Science 276, 238 (1997).CrossRefGoogle Scholar
38.Al-Shareef, H.N., Kingon, A.I., Chen, X., Bellur, K.R., Auciello, O., J. Mater. Res. 9, 2968 (1994).CrossRefGoogle Scholar
39.de Araujo, C.A-Paz, Cuchiaro, J.D., McMillan, L.D., Scott, M.C., Scott, J.F., Nature 374, 627 (1995).CrossRefGoogle Scholar
40.Moise, T.S., Summerfelt, S.R., McAdams, H., Aggarwal, S., Udayakumar, K.R., Celii, F., Martin, S., Xing, G., Hall, L., Taylor, K.J., Hurd, T., Rodriguez, J., Remack, K., Khan, M.D., Stacey, G., Yao, M., Albrecht, G., Zielinski, E., McKee, B., Rickes, J., Grace, J., Fong, J., Lee, D., Pietrzyk, C., Lanham, R., Gilbert, S., Taylor, D., Amano, J., Bailey, R., Chu, F., Fox, G., Sun, S., Davenport, T., in IEDM '02 Technical Digest (IEEE, Piscataway, NJ, 2002), pp. 535538.Google Scholar
41.Chahara, K., Ohno, T., Kasai, M., Kozono, Y., Appl. Phys. Lett. 63, 1990 (1993).CrossRefGoogle Scholar
42.von Helmolt, R., Wecker, J., Holzapfel, B., Schultz, L., Samwer, K., Phys. Rev. Lett. 71, 2331 (1993).CrossRefGoogle Scholar
43.Jin, S., Tiefel, T.H., McCormack, M., Fastnacht, R.A., Ramesh, R., Chen, L.H., Science 264, 413 (1994).CrossRefGoogle Scholar
44.Nagaev, E.L., Phys. Status Solidi B 186, 9 (1994).CrossRefGoogle Scholar
45.Uehara, M., Mori, S., Chen, C.H., Cheong, S.W., Nature 399, 560 (1999).CrossRefGoogle Scholar
46.Dagotto, E., Nanoscale Phase Separation and Colossal Magnetoresistance: The Physics of Manganites and Related Compounds (Springer, Berlin, 2003).CrossRefGoogle Scholar
47.Parkin, S.S.P., Annu. Rev. Mater. Sci. 25, 357 (1995).CrossRefGoogle Scholar
48.Triscone, J.-M., Karkut, M.G., Antognazza, L., Brunner, O., Ø. Fischer, Phys. Rev. Lett. 63, 1016 (1989).CrossRefGoogle Scholar
49.Iijima, K., Terashima, T., Bando, Y., Kamigaki, K., Terauchi, H., J. Appl. Phys. 72, 2840 (1992).CrossRefGoogle Scholar
50.Eckstein, J., Bozovic, I., Annu. Rev. Mater. Sci. 25, 679 (1995).CrossRefGoogle Scholar
51.Christen, H.-M., Boatner, L.A., Budai, J.D., Chisholm, M.F., Géa, L.A., Marrero, P.J., Norton, D.P., Appl. Phys. Lett. 68, 1488 (1996).CrossRefGoogle Scholar
52.Schlom, D.G., Haeni, J.H., Lettieri, J., Theis, C.D., Tian, W., Jiang, J.C., Pan, X.Q., Mater. Sci. Eng. B 87, 282 (2001).CrossRefGoogle Scholar
53.Ohtomo, A., Muller, D.A., Grazul, J.L., Hwang, H.Y., Nature 419, 378 (2002).CrossRefGoogle Scholar
54.Tybell, T., Ahn, C.H., Triscone, J.-M., Appl. Phys. Lett. 75, 856 (1999).CrossRefGoogle Scholar
55.Fong, D.D., Stephenson, G.B., Streiffer, S.K., Eastman, J.A., Auciello, O., Fuoss, P.H., Thompson, C., Science 304, 1650 (2004).CrossRefGoogle Scholar
56.Terashima, T., Shimura, K., Bando, Y., Matsuda, Y., Fujiyama, A., Komiyama, S., Phys. Rev. Lett. 67, 1362 (1991).CrossRefGoogle Scholar
57.Matsubara, S., Shohata, N., Mikami, M., Jpn. J. Appl. Phys. 24, Suppl. 24–3, 10 (1985).CrossRefGoogle Scholar
58.Tian, W., Jiang, J.C., Pan, X.Q., Haeni, J.H., Li, Y.L., Chen, L.Q., Schlom, D.G., Neaton, J.B., Rabe, K.M., Jia, Q.X., Appl. Phys. Lett. 89, 092905 (2006).CrossRefGoogle Scholar
59.Newnham, R.E., Skinner, D.P., Cross, L.E., Mater. Res. Bull. 13, 525 (1978).CrossRefGoogle Scholar
60.Levin, E.M., Robbins, C.R., McMurdie, H.F., Eds., Phase Diagrams for Ceramists (American Ceramic Society, Columbus, OH, 1964), vol. 1, p. 195.Google Scholar
61.Soukiassian, A., Tian, W., Tenne, D.A., Xi, X.X., Schlom, D.G., Lanzillotti-Kimura, N.D., Bruchhausen, A., Fainstein, A., Sun, H.P., Pan, X.Q., Cros, A., Cantarero, A., Appl. Phys. Lett. 90, 042909 (2007).CrossRefGoogle Scholar
62.Zheng, H., Wang, J., Lofland, S.E., Ma, Z., Mohaddes-Ardabili, L., Zhao, T., Salamanca-Riba, L., Shinde, S.R., Ogale, S.B., Bai, F., Viehland, D., Jia, Y., Schlom, D.G., Wuttig, M., Roytburd, A., Ramesh, R., Science 303, 661 (2004).CrossRefGoogle Scholar
63.Schlom, D.G., Chen, L.Q., Eom, C.B., Rabe, K.M., Streiffer, S.K., Triscone, J.-M., Annu. Rev. Mater. Res. 37, 589 (2007).CrossRefGoogle Scholar
64.Ino, S., Ichikawa, T., Okada, S., Jpn. J. Appl. Phys. 19, 1451 (1980).CrossRefGoogle Scholar
65.Ohta, H., Kim, S., Mune, Y., Mizoguchi, T., Nomura, K., Ohta, S., Nomura, T., Nakanishi, Y., Ikuhara, Y., Hirano, M., Hosono, H., Koumoto, K., Nat. Mater. 6, 129 (2007).CrossRefGoogle Scholar
66.Cho, A.Y., MRS Bull. 20, 21 (1995).CrossRefGoogle Scholar
67.Kim, K.H., Uehara, M., Kiryukhin, V., Cheong, S.-W., in Colossal Magnetoresistive manganites, Chatterjii, T. Ed. (Kluwer Academic, Dordrecht, 2004) pp. 131206.CrossRefGoogle Scholar