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Photomodulated Rayleigh Scattering from Single Semiconductor Nanowires

Published online by Cambridge University Press:  11 January 2012

Mohammad Montazeri
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States
Aaron Wade
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States
Melodie Fickenscher
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States
Howard E. Jackson
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States
Leigh M. Smith
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, Ohio 45221-0011, United States
Jan M. Yarrison-Rice
Affiliation:
Department of Physics, Miami University, Oxford, Ohio 45056, United States
Qiang Gao
Affiliation:
Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200, Australia
H. Hoe Tan
Affiliation:
Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200, Australia
Chennupati Jagadish
Affiliation:
Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200, Australia
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Abstract

We demonstrate the newly developed technique Photomodulated Rayleigh Scattering spectroscopy in order to probe the electronic band structure of single semiconductor nanowires. We show that both the electronic transition energies and nanowire diameter can be measured simultaneously and with high accuracy in a single non-destructive measurement. We demonstrate our results for zincblende GaAs as well as wurtzite InP nanowires where we probed the band gaps and transition energies at both room and low temperatures. This technique should advance the study of optical properties of single nanowires as well as other types of nanostructures.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

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