Physical Sciences
Characterization of Materials for Responsible Energy Generation and Use
Abstract
SEM of Carbon Coated LiFePO4 Through Silicon Nitride Windows in Liquid
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- 26 July 2009, pp. 1448-1449
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TEM Studies of Au/Si Epilayer Interfaces
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1450-1451
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The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy
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In Remembrance of Otto Scherzer, the Eminent Pioneer of Electron Optics
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- 26 July 2009, pp. 1452-1453
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Zernike Phase Contrast Electron Microscopy with a Spherically Corrected Foil Lens
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- 26 July 2009, pp. 1454-1455
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First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM
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- 26 July 2009, pp. 1456-1457
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Correction of Spherical Aberration and Six-Fold Astigmatism Using Three Dodecapoles,
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- 26 July 2009, pp. 1458-1459
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Aberration Correction and Electron Holography
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- 26 July 2009, pp. 1460-1461
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Aberration-Corrected STEM
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- 26 July 2009, pp. 1462-1463
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Simultaneous Z-Contrast/Phase Contrast Imaging of Ferroelectric Thin Films
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- 26 July 2009, pp. 1464-1465
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Progress towards an Absolute-Scale Quantification of HRTEM Images
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- 26 July 2009, pp. 1466-1467
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The Treatment of Spatial Incoherence in the Aberration Corrected STEM
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- 26 July 2009, pp. 1468-1469
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Defining HRTEM Resolution: Why Youngs Fringes Don't Measure Resolution
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- 26 July 2009, pp. 1470-1471
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Aberration Correction and Exit Wave Reconstruction Using Tilt Azimuth Data
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- 26 July 2009, pp. 1472-1473
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Prospects for Reliable 3D Imaging in Aberration-corrected STEM, TEM and SCEM
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- 26 July 2009, pp. 1474-1475
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Adatom on Graphene, Directly Imaged by Aberration Corrected TEM at 300kV
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- 26 July 2009, pp. 1476-1477
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Real-space Measurements of Bonding Charge Density in Aberration-corrected High Resolution Electron Microscopy
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- 26 July 2009, pp. 1478-1479
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Direct Imaging of Light Elements in Aberration-Corrected Scanning Transmission Electron Microscopy
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- 26 July 2009, pp. 1480-1481
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Behavior of Au Species in Au/FeOx Catalysts as a Result of In-Situ Thermal Treatments, Characterized via Aberration-Corrected STEM Imaging
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- 26 July 2009, pp. 1482-1483
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Electron Energy Loss Spectroscopy of Graphene Identified by Aberration, Corrected TEM at 300kV
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- 26 July 2009, pp. 1484-1485
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Imaging ZnO Nanobelts and Nanobelt Supported Metal Nanocatalysts by Aberration-corrected Scanning Transmission Electron Microscopy
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- 26 July 2009, pp. 1486-1487
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