Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advanced Characterization of Nuclear Fuels and Materials

Nanoscale Diffusion of Lead in 300Ma Old UTi2O6 Mineral

Towards Accurate and Reproducible Uranium Isotopic Analysis via Atom Probe Mass Spectrometry

High-Resolution Chemical-state Mapping and Analysis for Nuclear Safeguards with Microcalorimeter SEM-EDS

Advanced Electron Microscopy Characterization of Intergranular Corrosion in Ni-20Cr Alloy Under Molten Salt Environment

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Neon-FIB for the Fabrication of Tips for Atom Probe Tomography and Electron Tomography

Correlative Imaging of Phase Separation in Fe2TiO4 Thin Films Prepared by Conventional Ga and Xe Plasma FIB Processing

He-ion Beam Imaging for Accurate Hardware Trojan Detection

Novel Ion Species: An Exploratory Study of an Unknown Application Space

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

Approaching Operando Imaging of Functional Materials

Revealing the Dynamics of Functional Nanomaterials in Their Formation and Application Media with Liquid and Gas-phase TEM

In-situ Synthesis and in-operando Swelling/ Deswelling of PolyNIPAM Nanoparticles

Liquid-Phase Electron Spectroscopy of Individual Plasmonic Nanostructures

Revealing Early Stage Nucleation Events of Pharmaceutical Crystals Using Liquid Phase Electron Microscopy

Electron Pulses as an Ultrafast Probe for Non-equilibrium Processes

Development of Mega-electron-volt Ultrafast Electron Diffraction at SLAC National Accelerator Laboratory – Towards a Multifunctional Platform for Ultrafast Science

Nonequilibrium Electron and Lattice Dynamics of Strongly Correlated Quantum Materials

Quantifying Transient Strain and Energy of Coherent Acoustic Phonons with UEM Imaging

Using UEM to Probe Buried Structures in Real Space: An Analog to Phonon Spectroscopy

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

4D Scanning Electron Confocal Imaging and Visualization of Projected Bloch States

Resolving Hydrogen at Metal-metal Hydride Interfaces Using iDPC-STEM

Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advanced Characterization of Nuclear Fuels and Materials

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials

Electron Pulses as an Ultrafast Probe for Non-equilibrium Processes

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures