Article contents
Probing of Ag-based Resistive Switching on the Nanoscale
Published online by Cambridge University Press: 12 October 2011
Abstract
We study the switching characteristics of nanoscale junctions between a metallic tip and a silver film covered by a thin Ag2S ionic conductor layer. Resistive switching phenomena are studied on samples of various Ag2S layer thicknesses. Metallic and semiconductor behavior are distinguished by current-voltage characteristics measured at room temperature and at 4.2 K.
Keywords
- Type
- Research Article
- Information
- MRS Online Proceedings Library (OPL) , Volume 1331: Symposium K – Frontiers of Solid-State Ionics , 2011 , mrss11-1331-k01-07
- Copyright
- Copyright © Materials Research Society 2011
References
REFERENCES
- 2
- Cited by