Hostname: page-component-7bb8b95d7b-495rp Total loading time: 0 Render date: 2024-09-21T11:07:20.856Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of the Width of the Single Phase Stability Field of Nickel Titanate Spinel

Published online by Cambridge University Press:  21 February 2011

Ian M. Anderson  and
C. Barry Carter
Ian M. Anderson
Affiliation:
also with: Dept. of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
C. Barry Carter
Affiliation:
Dept. of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. S.E., Minneapolis, MN 55455
Get access

Abstract

The width of the single-phase stability field of nickel titanate spinel (Ni2(1+x)Ti1−xO4) has been determined in order to resolve an ambiguity in the analysis of the microstructure of equilibrated and quenched spinel-containing specimens. Bulk polycrystalline diffusion couples of the constituent oxides, NiO and NiTiO3, have been prepared at several reaction temperatures between 1400°C and 1550°C. The microstructure of the reaction layers of slow-cooled specimens has been examined by SEM and the composition has been mapped using x-ray microanalysis. It is concluded that the nickel titanate spinel phase has a narrow range of stability, and that the stoichiometry of the spinel is temperature dependent. The microstructure of equilibrated and quenched specimens is discussed in light of these findings.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991 , 175
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Armbruster, T., J. Solid State Chem. 36, 375 (1981).Google Scholar
[2] Lager, G.A., Armbruster, T., Ross, F.K., Rotella, F.J., and Jorgensen, J.D., J. Appl. Cryst. 14, 261 (1981).CrossRefGoogle Scholar
[3] DeGraef, M., Seinen, P.A., and Ijdo, D.J.W., J. Solid State Chem. 58, 357 (1985).CrossRefGoogle Scholar
[4] Anderson, I.M., Muan, A., and Carter, C.B., Proceedings for the XIIth International Congress for Electron Microscopy, 1058–1059 (1990).Google Scholar
[5] Simpson, Y.K., Colgan, E.G., and Carter, C.B., J. Am. Ceram. Soc. 70, C149–C151.Google Scholar