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High Resolution Imaging in the Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals
Published online by Cambridge University Press: 27 August 2014
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- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 16 - 17
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- Copyright © Microscopy Society of America 2014
References
[1]
Goldstein, J.I., et al, “Scanning Electron Microscopy and X-Ray Microanalysis”, (Springer, 3rd edition (2003).Google Scholar
[2]
Wells, O.C. “The construction of a scanning electron microscope and its application to the study offibres”, Ph.D. Dissertation, (Cambridge University, England, 1957).Google Scholar
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