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Applications of Optoelectrochemical Impedance Measurements on Electrolyte/Dielectric/Semiconductor Structure:Cartographic Analysis
Published online by Cambridge University Press: 21 February 2011
Abstract
The use of a weak modulated illumination with above-bandgap light energy as a probe scanning a Electrolyte/Dielectric/Semiconductor structure under electrochemical potentiostatic polarization gives an opportunity to obtain qualitative cartographies of different electrical parameters characterizing the Semiconductor/Dielectric interface.
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- Research Article
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- Copyright © Materials Research Society 1992
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