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Secondary Ion Mass Spectroscopy Study of Failure Mechanism in Organic Light Emitting Devices

Published online by Cambridge University Press:  17 March 2011

Lin Ke ,
Keran Zhang ,
Ramadas Senthil Kumar ,
Soo Jin Chua  and
Nikolai Yakovlev
Lin Ke
Affiliation:
Institute of Materials Research & Engineering, 3 Research Link, Singapore 117602
Keran Zhang
Affiliation:
Institute of Materials Research & Engineering, 3 Research Link, Singapore 117602
Ramadas Senthil Kumar
Affiliation:
Institute of Materials Research & Engineering, 3 Research Link, Singapore 117602
Soo Jin Chua
Affiliation:
Institute of Materials Research & Engineering, 3 Research Link, Singapore 117602
Nikolai Yakovlev
Affiliation:
Institute of Materials Research & Engineering, 3 Research Link, Singapore 117602
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Abstract

Secondary ion mass spectroscopy is used to examine the dark, non-emissive defects on the organic light-emitting device. Boundary movements are originated from electrode imperfection. Due to flexibility and movability of polymer layer, distribution variations and a more severe Indium and Calcium overlapping are detected in dark spot defect area. Boundary movements are not in good agreement between different layers. Interfaces became undulate. The closeness and proximity between the In sharp spikes and cathode metal protrusion leads to the initial point of dark spot. We demonstrate that the presence of cathode imperfection and interface roughness of different layers correlated to the device dark spot formation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 710: Symposia DD – Polymer Interfaces and Thin Films , 2001 , DD13.8.1
Copyright
Copyright © Materials Research Society 2002

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