Scanning probe microscopy (SPM) techniques have become a mainstay of nanoscience and nanotechnology by providing easy-to-use, gentle, structural imaging and manipulation on nanometer length scales. Beyond topographic imaging, SPMs have an extremely broad range of applications in probing electrical, magnetic, and mechanical properties. Despite impressive growth in applications, the traditional approach to SPM measurements—based on detection of cantilever response to a well-defined periodic excitation at a single frequency—has remained virtually identical for almost twenty years.