7 results
Real Time Acquisition and Calibration of S/TEM Probe Current Measurement Simultaneously with Any Imaging or Spectroscopic Signal
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 126-127
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- August 2018
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Development of Real-Time Probe Current Calibration for Performing Quantitative STEM with a Cold Field-Emission Gun.
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 940-941
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- July 2016
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Development of Quantitative STEM for a Conventional S/TEM and Real-Time Current Calibration for Performing QSTEM with a Cold Field Emission Gun
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2127-2128
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- August 2015
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High-Resolution Metrology in the TEM
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- Journal:
- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 46-49
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- May 2012
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Phase Detection Using Low-Loss EELS with Aberration Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 820-821
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- July 2011
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SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 628-629
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- July 2010
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High Resolution EFTEM and PEELS of Ga/GaAs Nano–“Ice Cream Cones” Grown by Dual-Wavelength Pulsed Laser Deposition
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1914-1915
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- August 2005
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