Atomic Force Microscopy (AFM) has become a ubiquitous tool for
analyzing the topography of a wide variety of materials, especially as
nanoscale features become more significant for both understanding as
well as determining materials properties [1]. Many AFM variations have
also been developed for measuring surface properties beyond
straightforward cartography. In many of these cases, the contrast
mechanisms are often either extremely complex, or not well understood,
even though the principles are simple. For example, Piezo-Force
Microscopy (PFM) is relatively easy to understand and use in a standard
lab for measuring electromechanical properties of materials, but care
must be taken in order to obtain quantitative results as described
below.