4 results
Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 844-845
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- August 2008
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Moving Beyond Bright Field Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1320-1321
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- August 2007
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Aberration Corrected and Monochromated STEM/TEM for Materials Science
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1180-1181
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- August 2007
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Application of Focused Ion Beam Microscopy to Astromaterials
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1534-1535
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- August 2007
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